Effects of Interface Roughness Scattering on Radio Frequency Performance of Silicon Nanowire Transistors
نویسندگان
چکیده
Effects of Interface Roughness Scattering on Radio Frequency Performance of Silicon Nanowire Transistors SungGeun Kim, a) Mathieu Luisier, 2 Timothy B. Boykin, and Gerhard Klimeck Network for Computational Nanotechnology, Purdue University, West Lafayette, IN 47907, USA Integrated Systems Laboratory, Gloriastrasse 35, ETH Zürich, 8092 Zürich, Switzerland The University of Alabama in Huntsville, Electrical and Computer Engineering, Huntsville, AL 35899, USA
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